Mohammed Nurul Afsar is a professor in the Department of Electrical and Computer Engineering at Tufts School of Engineering. He received B.S. and M.S. degrees in physics from the University of Dhaka, an M.S.E.E. in microwaves and quantum electronics from University College London, and a Ph.D. in experimental physics from the University of London. While working at the National Physical Laboratory of England from 1972-1978, Afsar developed the techniques of Fourier transform spectroscopy for precision measurement of complex refractive index and complex dielectric permittivity and loss tangent of materials at millimeter and submillimeter wave frequencies. Afsar is a chartered engineer in England and was elected as a fellow of the Institution of Electrical Engineers, London, in 1986. He is also a chartered physicist and a fellow of the Institute of Physics, London.
Mohammed Nurul Afsar's research interests include: precision microwave, millimeter, terahertz, and submillimeter wave, far-infrared, and infrared wave measurement techniques and instrumentation; millimeter and submillimeter wave sources, detectors, and systems; solid, liquid, and gaseous state physics, spectroscopy, material characterization and studies, complex dielectric permittivity, and complex magnetic permeability measurements of dielectric and magnetic materials; and theoretical studies of polymeric, glassy, amorphous, and chemical vapor deposition (CVD) grown materials, ceramic, and semiconductor materials, thin films, liquids and fluids, electronic, biological, and magnetic materials.