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Stylus Profilometer

The Dektak XT stylus profilometer employs a stylus scanned across a surface to characterize various features – step height, roughness, stress, etc. The instrument max step height is 1mm, max scan length is 55mm, resolution approximately 1nm, accuracy approximately 10nm.

No formal training or checkout is required. Please refer to the SOP and work with a more experienced user to become familiar with the tool.

Contacts: Robert White, Jim Vlahakis

Related Standard Operating Procedures: