Materials Characterization Laboratory

VASE UV-NIR Ellipsometer with focusing probes installed

The J.A. Woollam VASE UV-NIR Spectroscopic Ellipsometer is a versatile ellipsometry tool capable of optically examining the properties of semiconductors, dielectrics, polymers, metals, multi-layers, and more at thicknesses in the sub-nanometer range. The instrument can conduct a wide range of experiments and measurements in reflection and transmission. The ellipsometer's spectral range is 190-3000nm, and has heating and cryostat stages available for conducting experiments over a sample temperature range of 77K-873K. Accompanying the instrument is the J.A. Woollam WVASE software for analysis and modeling of optical data. range of 77K-873K. Accompanying the instrument is the J.A. Woollam WVASE software for analysis and modeling of optical data.

IR-VASE NIR-FIR Ellipsometer

The J.A. Woollam IR-VASE Mark II Ellipsometer is a new instrument capable of examining the optical properties of a wide range of materials in a spectral range from 1.7-30 μm. The instrument can conduct experiments in both reflection and transmission, and has heating and cryostat stages available for conducting experiments over a sample temperature range of 77K-873K. Accompanying the instrument is the J.A. Woollam WVASE software for analysis and modeling of optical data.

Lake Shore 8404 Hall Effect System

The Lake Shore Cryotronics model 8404 Hall measurement system allows for DC Hall effect and Van der Pauw measurements of semiconducting materials. The system electromagnet can generate a maximum field of ~1.67T. The system includes a low resistance option that allows examination of samples with resistances between approximately 0.1Ω and 10M Ω. A LN2 sample body is available for testing samples while immersed in LN2 at a temperature of ~78K. Sample sizes are limited to a maximum size of ~1cm x 1cm, and users should plan on depositing Ohmic contacts before coming to use the instrument.